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- Matthias Michelsburg, Robin Gruna, Kai-Uwe Vieth and Fernando Puente León. Spektrale Bandselektion für das Filterdesign optischer Inspektionssysteme. In Technisches Messen, Vol. 78(9):384-390, 2011.
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- Robin Gruna and Jürgen Beyerer. Optical feature extraction with illumination-encoded linear functions. InProc. SPIE Image Processing: Machine Vision Applications V, 8300, 2012
- Robin Gruna and Jürgen Beyerer. Acquisition and Evaluation of Illumination Series for Unsupervised Defect Detection. InProc. IEEE Instrumentation and Measurement Technology Conference, Pages 192–197. Hangzhou, China.
- Miro Sauerland, Robin Gruna and Jürgen Beyerer.
Materialidentifikation mittels optisch realisierter Kreuzkorrelation der Reflektanzspektren. In Tagungsband des XXV. Messtechnisches Symposiums, Pages 11-102, Karlsruhe, 2011